Title :
Direct Matching Among 3D Points-Sets in Scene Analysis
Author :
Gu, Weikang ; Zhang, Zhongfei ; Jing, Renjie
Author_Institution :
Zhejiang University
Keywords :
Image analysis; Impedance matching; Kernel; Layout; Mirrors; Testing;
Conference_Titel :
Systems, Man, and Cybernetics, 1988. Proceedings of the 1988 IEEE International Conference on
Print_ISBN :
7-80003-039-3
DOI :
10.1109/ICSMC.1988.712869
