DocumentCode :
2851634
Title :
Evaluation of quasi-ballistic transport in nano-MOSFETs by deterministic solver of the time dependent multi-subbands Boltzmann Transport Equation
Author :
Wang, Yong ; Lu, Tiao ; Liu, Xiaoyan ; Du, Gang
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
fYear :
2011
fDate :
17-18 Nov. 2011
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, the ballistic and quasi-ballistic transport characteristics of Sub-30 nm double gate MOSFETs are simulated by deterministic solver of the Time Dependent Muti-subbands Boltzmann Transport Equation [1]. The scattering effect on the Sub-30 nm double gate MOSFETs is investigated not only through analyzing ON current, but also the source to channel barrier height, average electron velocity and electron density at virtual source (VS: top of the barrier).
Keywords :
Boltzmann equation; MOSFET; nanoelectronics; average electron velocity; channel barrier height; deterministic solver; double gate MOSFET; electron density; nano-MOSFET; quasi-ballistic transport characteristics; scattering effect; time dependent multisubbands Boltzmann transport equation; virtual source; Boltzmann equation; Educational institutions; Logic gates; MOSFETs; Mathematical model; Scattering; Boltzmann Transport Equation; Quasi-ballistic transport; Virtual Source;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
Conference_Location :
Tianjin
ISSN :
Pending
Print_ISBN :
978-1-4577-1998-1
Electronic_ISBN :
Pending
Type :
conf
DOI :
10.1109/EDSSC.2011.6117726
Filename :
6117726
Link To Document :
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