Title :
Software-based BIST for Analog to Digital Converters in SoC
Author_Institution :
Menoufiya Univ., Menoufiya
Abstract :
Embedded software based self testing has recently become focus of intense research for microprocessor and memories in SoC. In this paper, we used the testing microprocessor and memory for developing software-based self-testing of analog to digital converters in SoC. The advantage of this methodology include at speed testing, low cost, and small test time. Simulation results show that the proposed method can detect not only catastrophic faults but also some parametric faults.
Keywords :
analogue-digital conversion; built-in self test; electronic engineering computing; system-on-chip; SoC; analog-to-digital converters; built-in self-testing; catastrophic faults; embedded software based self testing; parametric faults; software-based BIST; speed testing; Analog circuits; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Logic testing; Microprocessors; Software testing; ADC testing; SoC; Software-based BIST (SW-BIST);
Conference_Titel :
Design and Test Workshop, 2007. IDT 2007. 2nd International
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-1824-4
Electronic_ISBN :
978-1-4244-1825-1
DOI :
10.1109/IDT.2007.4437457
