DocumentCode :
2851887
Title :
An Incremental Approach for Pattern Diagnosability in Distributed Discrete Event Systems
Author :
Ye, Lina ; Dague, Philippe ; Yan, Yuhong
Author_Institution :
LRI, Univ. Paris-Sud 11, Orsay, France
fYear :
2009
fDate :
2-4 Nov. 2009
Firstpage :
123
Lastpage :
130
Abstract :
Diagnosability is a crucial property that determines at design stage how accurate any diagnosis algorithm can be on a partially observable system. Recent work on diagnosability has generalized fault event case to pattern case, which can describe more general objectives for diagnosis problem, but based on global model and global twin plant construction. In this paper, we propose an original framework to solve pattern diagnosability in a distributed way to avoid calculating global objects. We first show how to incrementally accomplish pattern recognition without building global model by propagating only diagnosability relative information between components. Then an efficient way to construct pattern verifier is proposed, which is inspired from the classical twin plant method but with smaller state space, to search for partial critical paths, whose global consistency is subsequently checked. Meanwhile we prove that the result obtained from our distributed approach is on an equality with that from the centralized one but the evaluation result shows that our search state space exploited is only a small subpart of the global twin plant, whose construction is unavoidable in the centralized approach.
Keywords :
discrete event systems; large-scale systems; pattern recognition; distributed discrete event system; pattern diagnosability approach; pattern recognition; Algorithm design and analysis; Artificial intelligence; Buildings; Discrete event systems; Fault diagnosis; Pattern analysis; Pattern recognition; State-space methods; Sufficient conditions; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Tools with Artificial Intelligence, 2009. ICTAI '09. 21st International Conference on
Conference_Location :
Newark, NJ
ISSN :
1082-3409
Print_ISBN :
978-1-4244-5619-2
Electronic_ISBN :
1082-3409
Type :
conf
DOI :
10.1109/ICTAI.2009.75
Filename :
5365443
Link To Document :
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