Title :
Schematic-Based Fault Dictionary: A Case Study
Author :
AbdEl-Halim, Mohammed Ali ; Amer, Hassanein H.
Author_Institution :
Mentor Graphics Egypt, Cairo
Abstract :
This paper uses the opamp1 benchmark circuit to show that existing fault models are not accurate enough in the context of defect-based tests. A simple DFT circuit is added to increase coverage to 100% without affecting normal circuit operation. Furthermore, it is shown that this DFT circuit changes the operation modes of insensitive transistors.
Keywords :
analogue circuits; circuit testing; discrete Fourier transforms; fault location; operational amplifiers; DFT; analog mixed signal test; defect-based tests; discrete Fourier transform; insensitive transistor; opamp1 benchmark circuit; schematic-based fault dictionary; Built-in self-test; Circuit faults; Circuit testing; Costs; Design engineering; Design for testability; Dictionaries; Performance evaluation; Production; Prototypes; Induced Fault analysis; analog fault model; analog mixed signal test; defect-based analog test; fault dictionary;
Conference_Titel :
Design and Test Workshop, 2007. IDT 2007. 2nd International
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-1824-4
Electronic_ISBN :
978-1-4244-1825-1
DOI :
10.1109/IDT.2007.4437472
