• DocumentCode
    2851926
  • Title

    A high-Psat high-PAE fully-integrated 5.8-GHz power amplifier in 0.18-µm CMOS

  • Author

    Wang, To-Po ; Ke, Ji-Hong ; Chiang, Cheng-Yu

  • Author_Institution
    Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
  • fYear
    2011
  • fDate
    17-18 Nov. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A 5.8-GHz 0.18-μm CMOS fully integrated power amplifier (PA) with high saturated output power (Psat), high output 1-dB compressed point (OP1dB), and high power-added efficiency (PAE) is presented in this paper. This PA consists of two stages, the first stage is the single-ended cascode stage for PAE boosting, and the second stage is the cascode power stage for output power enhancement. To further accurately predict the PA performance in terms of power gain, Psat, and PAE, the on-chip passive components including inductors, capacitor, and interconnections are considered by using full-wave electronic-magnetic (EM) tool. From the measured results, the fabricated 5.8-GHz PA delivers 21.4-dBm saturated output power (Psat), 23.6-dB power gain, and 39.7% PAE. Compared to previously published 5.8-GHz 0.18-μm CMOS PAs, this work demonstrated the superior performance in terms of Psat, OP1dB, and PAE.
  • Keywords
    CMOS analogue integrated circuits; capacitors; inductors; power amplifiers; CMOS; capacitor; cascode power; frequency 5.8 GHz; full-wave electronic-magnetic tool; gain 23.6 dB; high saturated output power; high-Psat high-PAE fully-integrated power amplifier; inductor; on-chip passive component; output 1-dB compressed point; power gain; power-added efficiency; size 0.18 mum; CMOS integrated circuits; Gain; Gain measurement; Power amplifiers; Power generation; Semiconductor device measurement; Wireless LAN; Power amplifier (PA); power-added efficiency (PAE); saturated output power (Psat);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
  • Conference_Location
    Tianjin
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-1998-1
  • Electronic_ISBN
    Pending
  • Type

    conf

  • DOI
    10.1109/EDSSC.2011.6117740
  • Filename
    6117740