DocumentCode :
2852144
Title :
Frequency Diagnostic Universal Fault Protection for Current Fed Parallel Electronic Resonant Ballast
Author :
Yu, Qinghong ; Parisella, Joe
Author_Institution :
Electron. Control Syst., Osram Sylvania, Beverly, MA
Volume :
1
fYear :
2006
fDate :
8-12 Oct. 2006
Firstpage :
257
Lastpage :
264
Abstract :
Current fed parallel resonant electronic ballasts (PREB) dominate the applications for the T8 fluorescent lamp in North America for the advantage of low cost, flexibility and high reliability. At fault condition, PREB generates much heat externally, but it is difficult to provide fault protection using traditional approaches without sacrificing other advantages of PREB. In this paper, a digital solution is presented to detect universal fault condition in PREB and preserve its other advantages. Analysis of the operational principal shows that the load impedance disturbance in PREB leads to operation frequency perturbation, which can be detected with a very simple and low cost digital device for fault protections. Experiments show that this frequency diagnostic provides very sensitive and reliable fault detection for PREB. With both end-of-life and anti-arcing protections solved with one algorithm, this technology provides a superior fault protection to one of the most widely used ballast topologies and greatly extends the potential applications of PREB in modern lighting industry
Keywords :
arcs (electric); digital circuits; fluorescent lamps; lamp accessories; lighting; overcurrent protection; North America; T8 fluorescent lamp; anti-arcing protections; current fed parallel electronic resonant ballast; digital device; electronic ballast; end-of-life protection; frequency diagnostic; load impedance disturbance; operation frequency perturbation; self-oscillation inverter; universal fault protection; Costs; Electronic ballasts; Fault detection; Fluorescent lamps; Frequency; Impedance; North America; Protection; Resonance; Topology; Electronic ballast; fault protection; self-oscillation inverter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
ISSN :
0197-2618
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2006.256533
Filename :
4025218
Link To Document :
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