DocumentCode
2852493
Title
Selecting observation platforms for optimized anomaly detectability under unreliable partial observations
Author
Wen-Chiao Lin ; Garcia, H.E. ; Tae-Sic Yoo
Author_Institution
Idaho Nat. Lab., Idaho Falls, ID, USA
fYear
2011
fDate
June 29 2011-July 1 2011
Firstpage
4470
Lastpage
4477
Abstract
Diagnosers for keeping track on the occurrences of special events in the framework of unreliable partially-observed discrete-event dynamical systems were developed in previous work. This paper considers observation platforms consisting of sensors that provide partial and unreliable observations and of diagnosers that analyze them. Diagnosers in observation platforms typically perform better as sensors providing the observations become more costly or increase in number. This paper proposes a methodology for finding an observation platform that achieves an optimal balance between cost and performance, while satisfying given observability requirements and constraints. Since this problem is generally computational hard in the framework considered, an observation platform optimization algorithm is utilized that uses two greedy heuristics, one myopic and another based on projected performances. These heuristics are sequentially executed in order to find best observation platforms. The developed algorithm is then applied to an observation platform optimization problem for a multi-unit-operation system. Results show that improved observation platforms can be found that may significantly reduce the observation platform cost but still yield acceptable performance for correctly inferring the occurrences of special events.
Keywords
discrete event systems; observability; optimisation; time-varying systems; greedy heuristics; multiunit-operation system; observability constraints; observability requirements; observation platform optimization algorithm; observation platform selection; optimal balance; optimized anomaly detectability; unreliable partial observations; unreliable partially-observed discrete-event dynamical systems; Algorithm design and analysis; Automata; Indexes; Monitoring; Optimization; Sensors; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2011
Conference_Location
San Francisco, CA
ISSN
0743-1619
Print_ISBN
978-1-4577-0080-4
Type
conf
DOI
10.1109/ACC.2011.5991124
Filename
5991124
Link To Document