DocumentCode :
2852567
Title :
On ATPG for multiple aggressor crosstalk faults in presence of gate delays
Author :
Ganeshpure, Kunal P. ; Kundu, Sandip
Author_Institution :
Massachusetts Amherst Univ., Amherst, MA
fYear :
2007
fDate :
21-26 Oct. 2007
Firstpage :
1
Lastpage :
7
Abstract :
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching around the same time the victim net switches. This is a well-known problem. In this paper, we present a novel solution assuming a unit delay model for the gates, combining 0-1 integer linear program (ILP) with traditional stuck-at fault ATPG. The maximal aggressor activation is formulated as a linear programming problem while the fault effect propagation is treated as an ATPG problem and the gate delays are subsumed by a circuit transformation. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 30-80%.
Keywords :
automatic test pattern generation; circuit reliability; crosstalk; delays; integer programming; linear programming; ATPG; circuit failure; coupling capacitance; gate delays; integer linear program; multiple aggressor crosstalk faults; pattern generation; Automatic test pattern generation; Capacitance; Circuit faults; Circuit testing; Coupling circuits; Crosstalk; Delay effects; Integrated circuit interconnections; Peer to peer computing; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2007.4437563
Filename :
4437563
Link To Document :
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