Title :
Statistical analysis of propagation delay in digital integrated circuits
Author :
Fox, P. ; Wernicke, F. ; Narayanasamy, R.
Author_Institution :
IBM Corp., Hopwell Junction, N.Y., USA
Abstract :
The Monte Carlo method has been applied to compute distributions of delay in a logic circuit. This paper will explain adopted approach, comparing computed results to distributions measured on manufactured product.
Keywords :
Digital integrated circuits; Distributed computing; Doping; Economic forecasting; Electrons; Logic circuits; Monte Carlo methods; Propagation delay; Statistical analysis; Transient analysis;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1972 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1972.1155013
