• DocumentCode
    2852693
  • Title

    New methods for receiver internal jitter measurement

  • Author

    Li, Mike P. ; Chen, Jinhua

  • Author_Institution
    Wavecrest Corp., San Jose, CA
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    We have developed three receiver internal deterministic jitter (DJ) and random jitter (RJ) measurement methods through external DJ stressing, RJ stressing, or sampling time shifting. High throughput jitter tolerance tests utilizing the receiver internal DJ and RJ are presented. Analytical formulas for receiver DJ and RJ estimation have been developed. Relevant simulations and laboratory experiments have been conducted and the validity for the methods has been verified. We have also shown that a 6 orders of magnitude reduction in test time can be achieved with a good statistical confidence with the proposed methods.
  • Keywords
    electric variables measurement; jitter; receivers; synchronisation; tolerance analysis; chip-to-chip interconnections; external deterministic jitter stressing; high throughput jitter tolerance tests; random jitter measurement methods; random jitter stressing; receiver internal jitter measurements; sampling time shifting; Application software; Bit error rate; Circuits; Clocks; Computer architecture; Jitter; Operating systems; Phase locked loops; Stress measurement; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437570
  • Filename
    4437570