DocumentCode
2852693
Title
New methods for receiver internal jitter measurement
Author
Li, Mike P. ; Chen, Jinhua
Author_Institution
Wavecrest Corp., San Jose, CA
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
10
Abstract
We have developed three receiver internal deterministic jitter (DJ) and random jitter (RJ) measurement methods through external DJ stressing, RJ stressing, or sampling time shifting. High throughput jitter tolerance tests utilizing the receiver internal DJ and RJ are presented. Analytical formulas for receiver DJ and RJ estimation have been developed. Relevant simulations and laboratory experiments have been conducted and the validity for the methods has been verified. We have also shown that a 6 orders of magnitude reduction in test time can be achieved with a good statistical confidence with the proposed methods.
Keywords
electric variables measurement; jitter; receivers; synchronisation; tolerance analysis; chip-to-chip interconnections; external deterministic jitter stressing; high throughput jitter tolerance tests; random jitter measurement methods; random jitter stressing; receiver internal jitter measurements; sampling time shifting; Application software; Bit error rate; Circuits; Clocks; Computer architecture; Jitter; Operating systems; Phase locked loops; Stress measurement; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2007.4437570
Filename
4437570
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