• DocumentCode
    2852764
  • Title

    Floating gate studies and photosensitivity investigations on charge-coupled devices

  • Author

    Copeland, M. ; Ibrahim, Amin ; Chamberlain, S. ; Jurgens, W. ; Chan, Chi Hou ; Caves, T.

  • Author_Institution
    Bell-Northern Research, Ltd., Ottawa, Ontario, Canada
  • Volume
    XV
  • fYear
    1972
  • fDate
    16-18 Feb. 1972
  • Firstpage
    134
  • Lastpage
    135
  • Abstract
    A report on the measurement of spectral response, NEP and speed of silicon gate charge-coupled imaging arrays will be offered. Additionally, the development of a discrete element CCD circuit model will be discussed, citing experimental results with floating-gate outputs.
  • Keywords
    Capacitance; Charge coupled devices; Charge transfer; Circuits; Clocks; Diodes; Electrodes; Nonlinear equations; Surface resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1972 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1972.1155020
  • Filename
    1155020
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2852764