• DocumentCode
    2853189
  • Title

    An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time

  • Author

    Yamaguchi, Takahiro J. ; Hou, Harry X. ; Takayama, Koji ; Armstrong, Dave ; Ishida, Masahiro ; Soma, Mani

  • Author_Institution
    Advantest Lab. Ltd., Sendai
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper proposes an FFT-based method that separates random jitter from deterministic jitter in clock and data patterns, with a 10X reduction in test time. The method has been verified experimentally on a 2.5 Gbps clock pattern & 7-stage PRBS, and gives results that are comparable to existing methods.
  • Keywords
    fast Fourier transforms; frequency-domain analysis; integrated circuit testing; timing jitter; FFT-based jitter separation method; high-frequency jitter testing; integrated circuit testing; Bandwidth; Circuit testing; Clocks; Curve fitting; Frequency domain analysis; Harmonic analysis; Jitter; Laboratories; Particle separators; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437607
  • Filename
    4437607
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2853189