Title :
An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time
Author :
Yamaguchi, Takahiro J. ; Hou, Harry X. ; Takayama, Koji ; Armstrong, Dave ; Ishida, Masahiro ; Soma, Mani
Author_Institution :
Advantest Lab. Ltd., Sendai
Abstract :
This paper proposes an FFT-based method that separates random jitter from deterministic jitter in clock and data patterns, with a 10X reduction in test time. The method has been verified experimentally on a 2.5 Gbps clock pattern & 7-stage PRBS, and gives results that are comparable to existing methods.
Keywords :
fast Fourier transforms; frequency-domain analysis; integrated circuit testing; timing jitter; FFT-based jitter separation method; high-frequency jitter testing; integrated circuit testing; Bandwidth; Circuit testing; Clocks; Curve fitting; Frequency domain analysis; Harmonic analysis; Jitter; Laboratories; Particle separators; Production;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437607
