Title :
Integrated passive components in MCM-Si technology and their applications in RF-systems
Author_Institution :
SICAN Res. & Dev., Hannover, Germany
Abstract :
Integrated passive components and their application in RF systems in a silicon-on-silicon multichip technology is presented. In high frequency devices, the main use of passive components is for decoupling purposes, matching networks, LC filters, tank circuits, hybrids, transformers, attenuators and power dividers. In most cases, the design of precise component values and high Q-factors for the inductors and capacitors is necessary, which is a difficult task for integrated components on silicon. General design aspects of passive components with their facilities and restrictions to improve their high frequency behaviour and quality factors are described. In particular, the impact of different substrate resistivities on their performance is pointed out. Test structures on substrates with resistivities of 15 Ωcm, 2000 Ωcm and 20000 Ωcm were therefore manufactured
Keywords :
Q-factor; capacitors; electrical resistivity; elemental semiconductors; hybrid integrated circuits; inductors; integrated circuit packaging; microwave filters; microwave integrated circuits; multichip modules; resistors; silicon; waveguide attenuators; waveguide couplers; 15 ohmcm; 2000 ohmcm; 20000 ohmcm; LC filters; MCM-Si technology; Q-factor; RF-systems; Si; attenuators; capacitors; decoupling; high frequency devices; hybrid circuits; inductors; integrated components; integrated passive components; matching networks; passive components; power dividers; quality factor; silicon-on-silicon multichip technology; substrate resistivity; tank circuits; test structures; transformers; Attenuators; Conductivity; Frequency conversion; Integrated circuit technology; Matched filters; Passive filters; Power dividers; Q factor; Radio frequency; Transformers;
Conference_Titel :
Multichip Modules and High Density Packaging, 1998. Proceedings. 1998 International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-4850-8
DOI :
10.1109/ICMCM.1998.670790