DocumentCode :
285336
Title :
Concurrent testing of analog filters using a programmable biquad
Author :
Huertas, Jose L. ; Vazquez, Diego ; Rueda, Adoración
Author_Institution :
Dept. de Diseno Analogico, Sevilla Univ., Spain
Volume :
1
fYear :
1992
fDate :
10-13 May 1992
Firstpage :
423
Abstract :
A practical architecture for implementing switched-capacitor filters that can be concurrently tested is reported. Signals applied during the normal operation of the filter allow for assessing whether or not the filter is under a fault condition. Instead of a full duplication of the filter, this approach only requires an extra filter stage (which must be electrically programmable) and a logic control circuit. Experimental results seem promising and encourage further research upon this topic
Keywords :
active filters; concurrent engineering; fault location; production testing; switched capacitor filters; analog filters; concurrent testing; fault condition; logic control circuit; programmable biquad; switched-capacitor filters; Analog circuits; Bibliographies; Capacitors; Circuit simulation; Circuit testing; Design methodology; Digital control; Filters; Flexible printed circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
Type :
conf
DOI :
10.1109/ISCAS.1992.229923
Filename :
229923
Link To Document :
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