• DocumentCode
    285336
  • Title

    Concurrent testing of analog filters using a programmable biquad

  • Author

    Huertas, Jose L. ; Vazquez, Diego ; Rueda, Adoración

  • Author_Institution
    Dept. de Diseno Analogico, Sevilla Univ., Spain
  • Volume
    1
  • fYear
    1992
  • fDate
    10-13 May 1992
  • Firstpage
    423
  • Abstract
    A practical architecture for implementing switched-capacitor filters that can be concurrently tested is reported. Signals applied during the normal operation of the filter allow for assessing whether or not the filter is under a fault condition. Instead of a full duplication of the filter, this approach only requires an extra filter stage (which must be electrically programmable) and a logic control circuit. Experimental results seem promising and encourage further research upon this topic
  • Keywords
    active filters; concurrent engineering; fault location; production testing; switched capacitor filters; analog filters; concurrent testing; fault condition; logic control circuit; programmable biquad; switched-capacitor filters; Analog circuits; Bibliographies; Capacitors; Circuit simulation; Circuit testing; Design methodology; Digital control; Filters; Flexible printed circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0593-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1992.229923
  • Filename
    229923