• DocumentCode
    2853366
  • Title

    Charge transfer in charge-coupled devices

  • Author

    Mohsen, A. ; McGill, T. ; Mead, C.

  • Author_Institution
    California institute of Technology, Pasadena, CA, USA
  • Volume
    XV
  • fYear
    1972
  • fDate
    16-18 Feb. 1972
  • Firstpage
    248
  • Lastpage
    249
  • Abstract
    Previous theoretical work 1-4 on the operation of charge-coupled devices has been rather qualitative. These studies emphasize one of a number of factors which can influence the charge-transfer process, for example, nonlinear diffusion 1-3 and fringing fields 4. However, none of these studies take account of all the factors in a realistic way.
  • Keywords
    Capacitive sensors; Charge coupled devices; Charge transfer; Circuits; Clocks; Electrodes; MOSFETs; Nonlinear equations; Physics; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1972 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1972.1155057
  • Filename
    1155057
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2853366