Title :
Charge transfer in charge-coupled devices
Author :
Mohsen, A. ; McGill, T. ; Mead, C.
Author_Institution :
California institute of Technology, Pasadena, CA, USA
Abstract :
Previous theoretical work 1-4 on the operation of charge-coupled devices has been rather qualitative. These studies emphasize one of a number of factors which can influence the charge-transfer process, for example, nonlinear diffusion 1-3 and fringing fields 4. However, none of these studies take account of all the factors in a realistic way.
Keywords :
Capacitive sensors; Charge coupled devices; Charge transfer; Circuits; Clocks; Electrodes; MOSFETs; Nonlinear equations; Physics; Shape;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1972 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1972.1155057
