DocumentCode
2853408
Title
Finding power/ground defects on connectors — a new approach
Author
Parker, Kenneth P. ; Hird, Stephen
Author_Institution
Agilent Technol., Loveland, CO
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
7
Abstract
Printed circuit boards are steadily becoming faster, and as a result, relatively ordinary defects in connectors and sockets can now have more subtle and damaging effects. At the same time these defects defy detection by conventional technologies. This paper surveys existing tests for these defects and introduces a new solution based on network parameter measurements.
Keywords
electric connectors; inspection; printed circuit testing; connector defects; ground defects; network parameter measurements; power defects; printed circuit boards; socket defects; Clocks; Connectors; Degradation; Electromagnetic interference; Electronic equipment testing; Keyways; Pins; Printed circuits; Signal design; Sockets;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2007.4437624
Filename
4437624
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