Improved techniques for multiple stuck-at fault analysis using single stuck-at fault test sets

Previous studies have suggested that many multiple stuck-at faults are detected by the test patterns generated to detect single stuck-at faults, but a fault simulation is often impossible, as their number grows and becomes enormous as real-sized circuits are considered. Thus, rules are needed to decrease their number by neglecting those that are surely detected by the patterns generated for single stuck-ats. A procedure is first given for establishing whether a multiple stuck-at fault is detected by a pattern. Then this procedure is used to prove a set of rules that allows the size of the fault list to be decreased significantly. Experimental results on the standard set of combinational benchmark circuits are provided, showing the effectiveness of the approach