Low cost automatic mixed-signal board test using IEEE 1149.4

This paper describes a low cost automatic test methodology for mixed signal boards based on IEEE 1149.4. The uniquely designed test hardware provides the access needed for measurements on a device interface board (DIB) through a device under test (DUT) socket and I/O connectors on the board. A new integrated software environment has been developed to automatically generate functional tests for board verification. This software environment utilizes schematic information, DIB specific constraints, accessibility provided by the test hardware and instrument automation tools to generate a functional test program. The test methodology presented in this paper reduces design expenses and time to market significantly in comparison with the existing techniques for mixed signal board testing.