DocumentCode :
28536
Title :
Energy-Efficient Digital Signal Processing via Voltage-Overscaling-Based Residue Number System
Author :
Jienan Chen ; Jianhao Hu
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Commun., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume :
21
Issue :
7
fYear :
2013
fDate :
Jul-13
Firstpage :
1322
Lastpage :
1332
Abstract :
In this paper, we apply the voltage overscaling (VOS) technique to the residue-number-system (RNS)-based digital signal processing system for achieving high energy efficiency. To mitigate the soft errors caused by VOS, we propose a new method, called joint RNS-RPR (JRR), which is the combination of RNS and the reduced precision redundancy (RPR) technique. The JRR technology inherits the properties of RNS, including shorter critical path, low complexity, and low power. Moreover, JRR can achieve higher power reduction than RNS for VOS applications. Since the soft errors caused by VOS lead to significant performance degradation of RNS, we use the information from RNS and RPR to achieve a high recovering probability of the soft errors with low hardware complexity. From the case study of finite impulse response (FIR) filter design based on the 0.25- μm 2.5-V CMOS technology, we find that JRR can save 62% more energy compared to the traditional FIR with a less than 2-dB signal noise ratio performance loss. We also find that JRR has lower complexity and better performance than the traditional soft error mitigation methods.
Keywords :
CMOS integrated circuits; FIR filters; circuit complexity; digital signal processing chips; energy conservation; power aware computing; probability; radiation hardening (electronics); residue number systems; CMOS technology; FIR filter design; JRR technology; RNS-based digital signal processing system; VOS; critical path; energy efficiency; energy-efficient digital signal processing; finite impulse response filter design; hardware complexity; joint RNS-RPR; noise figure 2 dB; power reduction; recovering probability; reduced precision redundancy; residue-number-system; signal noise ratio performance loss; size 0.25 mum; soft error mitigation; voltage 2.5 V; voltage overscaling; CMOS integrated circuits; Circuit complexity; Digital signal processing; Finite impulse response filter; Probability; Radiation hardening (electronics); Energy efficiency; joint RNS-RPR (JRR); reduced precision replica (RPR); residue number system (RNS);
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2012.2205953
Filename :
6255804
Link To Document :
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