• DocumentCode
    2853756
  • Title

    Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns

  • Author

    Bhargava, Gaurav ; Meehl, Dale ; Sage, James

  • Author_Institution
    Qualcomm, San Diego, CA
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Multi-capture-clock scan patterns for the traditional stuck-at-fault model have been used to reduce down pattern counts while still maintaining high test coverage. This paper studies how the same test patterns provide a decent N-detect fault coverage.
  • Keywords
    automatic test pattern generation; clocks; fault diagnosis; N-detect fault coverage; multicapture-clock scan patterns; serendipitous N-detect markoffs; stuck-at-fault model; Automatic test pattern generation; Clocks; Frequency; Logic; Performance evaluation; Pulse generation; Switches; Test pattern generators; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437648
  • Filename
    4437648
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2853756