Title :
Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns
Author :
Bhargava, Gaurav ; Meehl, Dale ; Sage, James
Author_Institution :
Qualcomm, San Diego, CA
Abstract :
Multi-capture-clock scan patterns for the traditional stuck-at-fault model have been used to reduce down pattern counts while still maintaining high test coverage. This paper studies how the same test patterns provide a decent N-detect fault coverage.
Keywords :
automatic test pattern generation; clocks; fault diagnosis; N-detect fault coverage; multicapture-clock scan patterns; serendipitous N-detect markoffs; stuck-at-fault model; Automatic test pattern generation; Clocks; Frequency; Logic; Performance evaluation; Pulse generation; Switches; Test pattern generators; Testing; Timing;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437648
