DocumentCode
2853766
Title
Linear Deformation Rate Derivation from Multi-baseline Differential Interferogram Stacks
Author
Ge, D.Q. ; Guo, X.F. ; Zhang, Leiqi ; Liu, S.W. ; Fan, J.H.
Author_Institution
China Area Geophys. Survey & Remote Sensing Center for Land Resources, Inst. of Remote Sensing Tech. & Methodology, Beijing
fYear
2006
fDate
July 31 2006-Aug. 4 2006
Firstpage
763
Lastpage
766
Abstract
Decorrelation caused by temporal changes influences phase unwrapping of differential interferogram in repeat-pass D-InSAR phase delay due to atmosphere disturbance degrades the accuracy of D-InSAR for small deformation monitoring. In this paper, we present a stacking D-InSAR approach using multi-baseline differential interferograms to estimate the linear deformation based on Rank Defect Free Network Adjustment Model (RDFNA) and to increase the deformation temporal sampling rate and estimate the linear deformation accurately. The Minimum Cost Flow (MCF) algorithm based on Delaunay triangulation network generated with sparse grids is adapted for phase unwrapping of individual interferogram. Scatterers with high coherence values over a given threshold in the interferogram stack are selected for the network generation. Therefore, with the multi-baseline differential interferogram stack, the linear deformation rate can be calculated with the unwrapped phase of each point accurately.
Keywords
geophysical techniques; image processing; mesh generation; radar interferometry; synthetic aperture radar; topography (Earth); Delaunay triangulation network; MCF algorithm; Minimum Cost Flow algorithm; RDFNA Model; Rank Defect Free Network Adjustment Model; atmosphere disturbance; linear deformation monitoring; multibaseline differential interferograms; phase unwrapping; stacking D-InSAR approach; temporal sampling rate; Atmosphere; Atmospheric modeling; Costs; Decorrelation; Deformable models; Degradation; Delay; Monitoring; Sampling methods; Stacking;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2006. IGARSS 2006. IEEE International Conference on
Conference_Location
Denver, CO
Print_ISBN
0-7803-9510-7
Type
conf
DOI
10.1109/IGARSS.2006.196
Filename
4241343
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