Title :
Choosing a filter structure: component sensitivity and design-for-testability
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oklahoma Univ., Norman, OK, USA
Abstract :
The choice of filter structure and its effects on circuit test and implementation sensitivity are examined. Preliminary results have shown the lattice structure to often have a low relative structure-algorithm time constant, making it a strong candidate for implementation in many applications. Since the parameters of such systems can be easily determined from input/output data, and the system design is insensitive to the design parameters, such structures can be used to advantage where design-for-testability is needed
Keywords :
design for testability; filters; network parameters; sensitivity analysis; circuit test sensitivity; component sensitivity; design-for-testability; filter structure; implementation sensitivity; lattice structure; Circuit testing; Computer science; Convergence; Fault detection; Filters; Integrated circuit interconnections; Lattices; Parameter estimation; Structural engineering; System testing;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.229969