JTAG system test in a MicroTCA world

Author

Van Treuren, Bradford G. ; Ley, Adam

Author_Institution

Alcatel-Lucent, Murray Hill, NJ

fYear

2007

fDate

21-26 Oct. 2007

Firstpage

1

Lastpage

10

Abstract

The telecommunications industry has developed new system architectures through the PCI Industrial Computer Manufacturers Group (PICMG) organization. These are the Advanced Telecom Computing Architecture (ATCA) platforms that consist of the ATCA, ATCA300, Advanced Mezzanine Card (AMC), and MicroTCA specifications. Unfortunately, only the AMC and MicroTCA specification directly addresses testability using an IEEE Std 1149.1 (JTAG) compatible interface. This paper will address the system test facility specified in the MicroTCA specification for testing the incorporated AMC modules as well as the MicroTCA Carrier Hub (MCH) controllers. Access to the individual AMC JTAG chains is provided using a JTAG Switch Module that provides a programmable star architecture in the system.

Keywords

telecommunication computing; telecommunication network management; IEEE Std 1149.1; JTAG system test; MicroTCA Carrier Hub controllers; MicroTCA world; programmable star architecture; telecommunications industry; testability; Communication industry; Computer aided manufacturing; Computer architecture; Computer industry; Control systems; Manufacturing industries; Switches; System testing; Telecommunication computing; Test facilities;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2007. ITC 2007. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

978-1-4244-1127-6

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2007.4437657

Filename

4437657