DocumentCode :
2853884
Title :
Protocol requirements in an SJTAG/IJTAG environment
Author :
Carlsson, Gunnar ; Holmqvist, Johan ; Larsson, Erik
Author_Institution :
Ericsson AB, Stockholm
fYear :
2007
fDate :
21-26 Oct. 2007
Firstpage :
1
Lastpage :
9
Abstract :
Integrated circuits, printed circuits boards, and multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/ IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT.
Keywords :
boundary scan testing; field programmable gate arrays; integrated circuit testing; printed circuit testing; protocols; FPGA; IJTAG environment; STAPL; boundary scan standard; devices-under-test; embedded on-chip instruments; integrated circuits; internal joint test access group; multiboard systems; printed circuits boards; protocol requirements; standard test-and-programming language; system JTAG; system test manager; system-level test management; test controller; Access protocols; Circuit testing; Communication standards; Computer languages; Field programmable gate arrays; Instruments; Integrated circuit testing; Printed circuits; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2007.4437658
Filename :
4437658
Link To Document :
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