DocumentCode :
2853928
Title :
Design of an Impulse Commutation Bridge for the Solid-State Transfer Switch
Author :
Cheng, Po-Tai ; Chen, Yu-Hsing
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu
Volume :
2
fYear :
2006
fDate :
8-12 Oct. 2006
Firstpage :
1024
Lastpage :
1031
Abstract :
Voltage sags have become a very critical power quality issue in recent years. Especially in the high-tech industry parks of Taiwan, manufacturers can lose up to a million US dollars for each voltage sag events. Some utility companies provide dual power feeders to these high-tech manufacturers to enhance power quality and reliability. The solid-state transfer switch (STS) based on thyristors can thus utilize the dual power feeders to protect sensitive loads against voltage sags. Conventional STS often require more than quarter cycle to complete the transfer process because its commutation is load dependent. An improved STS with impulse commutated circuit (ICSTS) can greatly reduce the transfer time and provide better ride-through capability against voltage sags. In this paper, an impulse commutation bridge STS (ICBSTS) system is proposed to further reduce the number of the passive components required for forced-commutation. This paper will also discuss the in-rush phenomenon of the transformer due to the line transfer. A flux estimator is developed with the ICBSTS system to reduce the inrush current
Keywords :
commutation; power transformers; pulsed power switches; thyristor applications; ICBSTS; Taiwan; dual power feeders; flux estimator; impulse commutated circuit; impulse commutation bridge STS; in-rush current; power quality; power reliability; solid-state transfer switch; thyristors; voltage sag events; Bridge circuits; Manufacturing industries; Power quality; Power system stability; Protection; Sociotechnical systems; Solid state circuits; Switches; Thyristors; Voltage fluctuations; flux estimator; impulse commutation bridge STS; in-rush current; power quality; solid-state transfer switch; voltage sag;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
ISSN :
0197-2618
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2006.256650
Filename :
4025336
Link To Document :
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