Cost effective manufacturing test using mission mode tests

Author

Aggarwal, Parmod

Author_Institution

Sun Microsyst. Inc., Santa Clara, CA

fYear

2007

fDate

21-26 Oct. 2007

Firstpage

1

Lastpage

8

Abstract

Mission mode testing, using application level tests on the top of end-customer operating environment, provides a cost effective complement to other tests during manufacturing test of high quality computer systems. It offers unique benefits which are not available with other types of tests. This paper discusses our experience with using Mission Mode tests, their effectiveness and costs, during manufacturing at Sun.

Keywords

built-in self test; integrated circuit testing; logic testing; microprocessor chips; OS level test; application level tests; built-in self-test; cost effective manufacturing test; diagnostic test; end-customer operating environment; high quality computer systems; in-system test; mission mode testing; native processor test; online test; platform test; Acoustic testing; Application software; Automatic testing; Circuit testing; Costs; Hardware; Operating systems; Pulp manufacturing; Sun; System testing; ATE; BIST; Diagnostic-test; In-System Test; Mission Mode Test; Native Processor Test; OS level Test; Online Test; POST; Platform Test; System Test; Validation;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2007. ITC 2007. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

978-1-4244-1127-6

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2007.4437662

Filename

4437662