Title :
At-speed structural test: Getting more real every day
Author_Institution :
Texas Instrum. Inc., Dallas, TX
Abstract :
The panel deals with the question of whether or not it is possible to rely solely on structural test techniques to fully test an integrated circuit (IC). The position of the author is that it is not only possible, but that the proportion of test content occupied by functional/application patterns is continuing to decrease over time.
Keywords :
integrated circuit testing; at-speed structural test techniques; integrated circuit testing;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
DOI :
10.1109/TEST.2007.4437668
