Title :
At-speed scan tests: Reality or fantasy?
Author_Institution :
Freescale Semiconductor, 7700 W. Parmer Ln, Austin, TX 78729, USA
Abstract :
In the world of digital logic, Scan Technology has held the promise of providing a mechanism for costeffective testing. Indeed, for the stuck-at fault model, Scan has served well. However stuck-at fault model is now inadequate. For Speed Testing, Scan technology has provided help - in the form of At-Speed Scan Testing - but the industry still requires functional tests in order to achieve testing quality and accuracy. This position statement argues why At-Speed Scan Tests are still a fantasy and what is needed in order to make it a reality.
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
DOI :
10.1109/TEST.2007.4437672
