Title :
Low-complexity MCM-D technology with integrated passives for high frequency applications
Author :
De Samber, Marc ; Pulsford, Nick ; Van Delden, Marc ; Milsom, Robert
Author_Institution :
Philips Res., Eindhoven, Netherlands
Abstract :
A silicon based technology for the integration of passive components into a MCM substrate is described. It is based on mature LSI technology, which makes it suitable for production in standard IC fabs. Using a double metal back-end process on isolated high-ohmic silicon and incorporating a resistor layer, thin film resistors, capacitors and inductors can be made with only 5 lithographic steps. By using thick gold as the top metal layer, good quality factors for the inductors are obtained, thus making RF applications feasible. This gold layer is also used for eutectic bonding of naked discrete silicon devices. A 1.3 GHz phase locked loop (PLL) module has been made as a demonstration of the combination of a passive integrated substrate and active dies mounted on top, thus forming a RF MCM-D. Mounting technology is based on the combination of standard IC mounting and discrete device mounting. The module contains a passive integration substrate with 55 integrated passives, 1 synthesiser IC and 3 discrete semiconductor devices
Keywords :
Q-factor; elemental semiconductors; inductors; integrated circuit interconnections; integrated circuit metallisation; lithography; microassembling; multichip modules; phase locked loops; silicon; thin film capacitors; thin film devices; thin film resistors; 1.3 GHz; IC mounting; LSI technology; MCM substrate; MCM-D mounting technology; MCM-D technology; PLL module; RF MCM-D; RF applications; Si; active dies; discrete device mounting; discrete semiconductor devices; discrete silicon devices; double metal back-end process; gold layer eutectic bonding; high frequency applications; integrated passives; isolated high-ohmic silicon; lithographic steps; low complexity MCM-D technology; passive component integration; passive components; passive integrated substrate; passive integration substrate; phase locked loop module; quality factors; resistor layer; silicon based technology; standard IC fab production; synthesiser IC; thick gold top metal layer; thin film capacitors; thin film inductors; thin film resistors; Gold; Isolation technology; Large scale integration; Phase locked loops; Production; Radio frequency; Resistors; Silicon; Substrates; Thin film inductors;
Conference_Titel :
Multichip Modules and High Density Packaging, 1998. Proceedings. 1998 International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-4850-8
DOI :
10.1109/ICMCM.1998.670795