• DocumentCode
    2854103
  • Title

    Boundary-scan: Built to last? Panel synopsis

  • Author

    Eklow, B.

  • Author_Institution
    Cisco Syst. Inc., San Jose, CA
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The IEEE 1149.1 standard has been a workhorse for the board test community. The authors of the standard had tremendous foresight into a problem (test point access) that was not significant at the time but became "critical" over the next several years. Now, more than 15 years later, 1149.1 is still used extensively. However, the nature of the circuits that are being tested is changing rapidly and significantly. Will a similar "foresight" be needed to address the test access issues of the future?
  • Keywords
    IEEE standards; boundary scan testing; IEEE 1149.1 standard; boundary-scan testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437673
  • Filename
    4437673
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2854103