• DocumentCode
    2854129
  • Title

    Boundary-scan: Built to last? panel position

  • Author

    Nejedlo, J.

  • Author_Institution
    Intel, Hillsboro, OR
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    IEEE 1149.1 standard has been used extensively by the board test community to date. However, the nature of the circuits that are being tested is changing rapidly and significantly. In light of these changes and others the boundary scan technology will not likely survive long term. Higher levels of integration in silicon devices, increases in board density, and platform performance constraints will also play a role. Finally, the ever increasing customer quality expectations (at lower costs, by the way) will likely add nails to the coffin as well. That all being said some limited usage is expected to continue on lower density PCB´s and non-performance critical 10 interfaces for some time yet.
  • Keywords
    boundary scan testing; printed circuit testing; IEEE 1149.1 standard; board density; board test; boundary scan technology; circuit test; platform performance constraints;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437675
  • Filename
    4437675