DocumentCode
2854129
Title
Boundary-scan: Built to last? panel position
Author
Nejedlo, J.
Author_Institution
Intel, Hillsboro, OR
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
2
Abstract
IEEE 1149.1 standard has been used extensively by the board test community to date. However, the nature of the circuits that are being tested is changing rapidly and significantly. In light of these changes and others the boundary scan technology will not likely survive long term. Higher levels of integration in silicon devices, increases in board density, and platform performance constraints will also play a role. Finally, the ever increasing customer quality expectations (at lower costs, by the way) will likely add nails to the coffin as well. That all being said some limited usage is expected to continue on lower density PCB´s and non-performance critical 10 interfaces for some time yet.
Keywords
boundary scan testing; printed circuit testing; IEEE 1149.1 standard; board density; board test; boundary scan technology; circuit test; platform performance constraints;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Type
conf
DOI
10.1109/TEST.2007.4437675
Filename
4437675
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