DocumentCode
2854138
Title
Is IEEE Std 1149.1 running out of gas? No way!
Author
Parker, K.P.
Author_Institution
Agilent Technol., Loveland, CO
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
1
Abstract
Boundary-scan was always intended to be used for loaded board testing, to help find manufacturing defects at the board level such as shorted nets, opens solder joints, missing devices, etc. And yet, it has been firmly grasped by IC designers as a gateway to solving IC testing problems as well.
Keywords
IEEE standards; boundary scan testing; integrated circuit testing; IEEE 1149.1 standard; boundary-scan test; integrated circuit testing; loaded board testing; manufacturing defects;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Type
conf
DOI
10.1109/TEST.2007.4437676
Filename
4437676
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