Title :
Does test have a greater role to play in the DFM process?
Author :
Venkataraman, S.
Author_Institution :
Intel Corp., Hillsboro, OR
Abstract :
Test and diagnostics of SRAM vehicles, test chips and products has the potential to provide the feedback to identify and quantify DFM-related issues including both functional yield and parametric issues (power and performance). Does testing have a greater role to play in the DFM process? The scope of tests includes product test, test of test-structures and on-product structures like ring-oscillators. It also includes not just wafer and final tests but also characterization and even field tests. Broadly, it is learning from silicon using tests.
Keywords :
SRAM chips; design for manufacture; integrated circuit testing; DFM process; SRAM chips; design for manufacture; integrated circuit testing; ring oscillators;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
DOI :
10.1109/TEST.2007.4437684
