• DocumentCode
    2854310
  • Title

    Well-targeted design-for-manufacturability[DFM] through test

  • Author

    Gattiker, A.

  • Author_Institution
    Austin Res. Lab., IBM, Austin, TX
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    In summary, test needs to expand its efforts to guide DFM because of product-test´s inherent coverage of the physical and electrical configurations in the design, inherent reflection of the impact of imperfections on the product, and ability to account for true product quality (DPM) as well as yield.
  • Keywords
    design for manufacture; integrated circuit design; integrated circuit testing; production testing; DFM; IC testing; design-for-manufacturability; electronic product quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437685
  • Filename
    4437685
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2854310