Title :
The essential role of test in DFM
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX
Abstract :
Design for manufacturing (DFM) is essential to achieving competitive yields in deep submicron technologies. The limiting factor in the successful application of DFM is manufacturing data. However, collecting this manufacturing data is increasingly difficult and expensive.
Keywords :
design for manufacture; integrated circuit manufacture; integrated circuit testing; manufacturing data processing; deep submicron technology; design for manufacturing; limiting factor; manufacturing data;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
DOI :
10.1109/TEST.2007.4437687
