Title :
Position statement
Author_Institution :
LSI Corp., Milpitas, CA
Abstract :
A fundamental shift from pass/fail testing to test-for-yield (TFY) is required where adaptive decision making and information collection at test extracts maximum value from the structural testing.
Keywords :
design for manufacture; integrated circuit yield; adaptive decision making; defect inspection; design for manufacture; scribeline testing; test-for-yield; yield improvement;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
DOI :
10.1109/TEST.2007.4437688
