Title :
Where is car IC testing going?
Author_Institution :
Texas Instrum., Inc., Dallas, TX
Abstract :
Car ICs will continue to increase in complexity and integration. Test must evolve to maintain quality while not allowing test cost to increase as a percent of the overall cost of the product. Better design for test methods and more focus on DFT will be required to achieve this goal.
Keywords :
automotive electronics; design for testability; integrated circuit design; integrated circuit testing; car IC testing; design for test; quality maintenance; Automotive engineering; Cost function; Design for testability; Design methodology; Driver circuits; Instruments; Integrated circuit testing; Logic testing; Product design; Stability;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437696
