Title :
A low-light-level self-scanned MOS image sensor
Author :
Plummer, James ; Meindl, J.
Author_Institution :
Stanford Univ., Stanford, Cal., USA
Abstract :
A low-light-level self-scanned MOS image sensor using new signal processing and scanning techniques to eliminate completely switching transient noise from the array output has been developed.
Keywords :
Automatic testing; Circuit testing; Image sensors; Lighting; Optical arrays; Registers; Retina; Sensor arrays; Switches; Switching circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1972 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1972.1155120
