Title :
Car IC test changing but the same quality goal
Author_Institution :
Freescale Semicond. Inc., Austin, TX
Abstract :
No matter how the auto IC industry evolves with the standards organizations and consortiums, the semiconductor suppliers must still meet the zero-defect quality requirement imposed by the automotive industry.
Keywords :
automobile industry; integrated circuit manufacture; integrated circuit testing; auto IC industry; automotive industry; car IC test; semiconductor suppliers; zero-defect quality; Automotive engineering; Best practices; Design for manufacture; Design for testability; Integrated circuit testing; Manufacturing industries; Manufacturing processes; Semiconductor device manufacture; Semiconductor device testing; Standards organizations;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437698
