Title : 
A new piecewise-linear simulation algorithm using switch-level pattern dynamics
         
        
            Author : 
Asai, Hideki ; Suzuki, Seiji
         
        
            Author_Institution : 
Dept. of Opt-electron. & Mech. Eng., Shizuoka Univ., Hamamatsu, Japan
         
        
        
        
        
        
            Abstract : 
Describes a novel piecewise-linear simulation technique, which is classified between the previous switch-level simulation and the circuit (or timing) level one, for bipolar transistor circuits. In this method, a piecewise-linear model with a switch is adopted as a diode. Tracing the regions is carried out by the transition of the switch state patterns. First, the node voltages and the branch currents are obtained by solving the linear equation based on the modified nodal approach at each iteration. Based on these computation results, the switch state zk+1 at the next iteration is determined by the switch control which is defined as the consistent switching method. Iteration is repeated until zk+1=zk , namely, the switch state pattern converges. Since the plural switch states can alter simultaneously, efficient tracing can be performed. The authors apply the proposed algorithm to the DC analysis of bipolar digital circuits and show its availability
         
        
            Keywords : 
bipolar transistor circuits; circuit analysis computing; digital simulation; piecewise-linear techniques; DC analysis; bipolar transistor circuits; branch currents; consistent switching method; digital circuits; linear equation; modified nodal approach; node voltages; piecewise-linear simulation algorithm; plural switch states; switch state patterns; switch-level pattern dynamics; Algorithm design and analysis; Bipolar transistor circuits; Circuit simulation; Diodes; Equations; Piecewise linear techniques; Switches; Switching circuits; Timing; Voltage;
         
        
        
        
            Conference_Titel : 
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
         
        
            Conference_Location : 
San Diego, CA
         
        
            Print_ISBN : 
0-7803-0593-0
         
        
        
            DOI : 
10.1109/ISCAS.1992.230076