Title :
Nonlinear effects in transistors caused by thermal power feedback: simulation and modeling in SPICE
Author :
Schurack, E. ; Latzel, T. ; Rupp, W. ; Gottwald, A.
Author_Institution :
Inst. for Commun. Eng., Federal Armed Forces Univ., Munich, Neubiberg, Germany
Abstract :
In order to evaluate the influence of the internal power dependent thermally effected feedback in bipolar transistors, a model for SPICE simulation is proposed which considers several variable temperature influences on transistor parameters as well as a complex thermal network. Measurement methods for determination of essential parameter values are suggested. Results of SPICE simulations are presented
Keywords :
SPICE; bipolar transistors; feedback; semiconductor device models; SPICE; bipolar transistors; complex thermal network; internal power; thermal power feedback; transistor parameters; variable temperature influences; Bipolar transistors; Circuit simulation; Fluctuations; Force feedback; Power dissipation; Power engineering and energy; SPICE; Temperature dependence; Thermal engineering; Thermal force;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230081
