Title :
A universal DC to logic performance correlation
Author :
Marshall, Andrew
Author_Institution :
Texas Instrum. Inc., Dallas, TX
Abstract :
A correlation of DC component and circuit characteristics to logic path performance is presented which is more accurate than previous correlations, and permits a predictive assessment of performance over multiple process nodes, given a limited set of DC component values.
Keywords :
logic gates; logic testing; NAND gates; logic speed performance; logic testing; predictive assessment; universal DC component; Delay; Frequency; Inverters; Logic circuits; Logic gates; Logic testing; MOS devices; Ring oscillators; Switches; Voltage;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437701
