Title :
Automatic meter reading with MNOS memory
Author :
Cricchi, J. ; Britton, J. ; Ottobre, L.
Author_Institution :
Westinghouse Elec. Corp., Baltimore, Md., USA
Abstract :
An LSI automatic meter reading subsystem utilizing nonvolatile MNOS memory for data storage during power outage will be described. Semiconductor technology provides a low-cost, reliable and low-power approach to remote automatic meter reading.
Keywords :
Automatic meter reading; Circuit noise; Costs; Counting circuits; Data communication; Large scale integration; Logic functions; Nonvolatile memory; Silicon; Threshold voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1972 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1972.1155126
