Title :
The critical path for multiple faults
Author :
Makar, S. ; McCluskey, E.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
The critical path technique for determining the single stuck-at faults detected by a test is extended to multiple faults by defining masking paths. A masking tree is used to represent the masking relationships among individual faults. These relationships are then used to determine which multiple faults are actually detected by a test.<>
Keywords :
fault location; logic testing; trees (mathematics); critical path; logic testing; masking paths; masking tree; multiple faults; stuck-at faults; Circuit faults; Circuit simulation; Circuit testing; Computer science; Electrical fault detection; Fault detection; Laboratories; Manufacturing; System testing; Very large scale integration;
Conference_Titel :
Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-1986-4
DOI :
10.1109/ICCAD.1989.76927
