Title :
The elimination of tuning-induced burnout and bias circuit oscillations in IMPATT oscillators
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Abstract :
The physical origins, equivalent circuit, experimental characterization and the principles and techniques for the stabilization of bias circuit instabilities in IMPATT oscillators will be discussed.
Keywords :
Circuit noise; Current measurement; Diodes; Gallium arsenide; Impedance; Low-frequency noise; Microwave circuits; Oscillators; Radio frequency; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1973.1155154
