Title :
Characterization of charge-coupled device line and area-array imaging at low light levels
Author :
White, M. ; Lampe, D. ; Mack, I. ; Blaha, F.
Author_Institution :
Westinghouse Electric Corp., Baltimore, MD, USA
Abstract :
A cell design affording compacting of an active CCD sensor, interline shift sensor, transfer gate and stopper diffusion into 2-mil centers with 5-m aluminum lines and spacings in a 75 × 100 element array will be described. Coherent readout technique removes Nyquist noise and suppresses clock feedthroughs.
Keywords :
Charge coupled devices; Circuit noise; Clamps; Delay lines; Dynamic range; Noise generators; Optical coupling; Semiconductor device noise; Silicon; Switches;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1973.1155159
