DocumentCode :
2855177
Title :
SPECS simulation validation with efficient transient sensitivity computation
Author :
Nguyen, T.V. ; Feldmann, P. ; Director, S.W. ; Rohrer, R.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1989
fDate :
5-9 Nov. 1989
Firstpage :
252
Lastpage :
255
Abstract :
Transient sensitivity computation in SPECS (simulation program for electronic circuits and systems), which provides a unique capability both to enhance efficiency and to validate simulation results, is described. By using transient sensitivities with respect to the entries of piecewise constant (table) element models and suppressed parasitics, an initially crude and correspondingly quick simulation can be undertaken and then augmented if necessary for improved accuracy. More specifically, table models are refined and parasitics reintroduced only where required in the final analysis as indicated by sensitivity results. This overall approach increases confidence in the results of the SPECS simulation strategy which relies heavily on simplified models for its enhanced efficiency.<>
Keywords :
circuit analysis computing; sensitivity analysis; SPECS simulation validation; electronic circuits and systems; piecewise constant; simulation program; table models; transient sensitivity computation; Capacitance; Circuit simulation; Circuit synthesis; Computational modeling; Computer simulation; Costs; Digital circuits; MOSFETs; Performance gain; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-1986-4
Type :
conf
DOI :
10.1109/ICCAD.1989.76947
Filename :
76947
Link To Document :
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