• DocumentCode
    2855177
  • Title

    SPECS simulation validation with efficient transient sensitivity computation

  • Author

    Nguyen, T.V. ; Feldmann, P. ; Director, S.W. ; Rohrer, R.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1989
  • fDate
    5-9 Nov. 1989
  • Firstpage
    252
  • Lastpage
    255
  • Abstract
    Transient sensitivity computation in SPECS (simulation program for electronic circuits and systems), which provides a unique capability both to enhance efficiency and to validate simulation results, is described. By using transient sensitivities with respect to the entries of piecewise constant (table) element models and suppressed parasitics, an initially crude and correspondingly quick simulation can be undertaken and then augmented if necessary for improved accuracy. More specifically, table models are refined and parasitics reintroduced only where required in the final analysis as indicated by sensitivity results. This overall approach increases confidence in the results of the SPECS simulation strategy which relies heavily on simplified models for its enhanced efficiency.<>
  • Keywords
    circuit analysis computing; sensitivity analysis; SPECS simulation validation; electronic circuits and systems; piecewise constant; simulation program; table models; transient sensitivity computation; Capacitance; Circuit simulation; Circuit synthesis; Computational modeling; Computer simulation; Costs; Digital circuits; MOSFETs; Performance gain; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-1986-4
  • Type

    conf

  • DOI
    10.1109/ICCAD.1989.76947
  • Filename
    76947