DocumentCode :
2855262
Title :
Design of sub-90 nm circuits and design methodologies
Author :
Devgan, Anirudh ; Puri, Ruchir ; Sapatnaker, Sachin ; Karnik, Tanay ; Joshi, Rajiv
Author_Institution :
IBM Res., Austin, TX, USA
fYear :
2005
fDate :
21-23 March 2005
Firstpage :
5
Lastpage :
6
Abstract :
Summary form only given. The tutorial discusses the design challenges of scaled CMOS circuits in sub-90 nm technologies and the design methodologies required in order to produce robust designs with the desired power-performance trade-off. We focus on four major components: design challenges of sub-90 nm CMOS circuits with particular emphasis on the implications of each individual device scaling element on circuit design; design methodologies for implementing robust circuits with desired power performance characteristics; managing leakage power; circuit design in the presence of uncertainty.
Keywords :
CMOS integrated circuits; design engineering; integrated circuit design; nanoelectronics; circuit design methodologies; device scaling element; leakage power; power-performance trade-off; robust designs; scaled CMOS circuits; uncertainty; CMOS technology; Circuit synthesis; Delay; Design engineering; Design methodology; Integrated circuit interconnections; Robustness; Routing; Space technology; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN :
0-7695-2301-3
Type :
conf
DOI :
10.1109/ISQED.2005.45
Filename :
1410546
Link To Document :
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