Title :
Scanning near-field optical microscope probes: fabrication and properties
Author :
Dryakhlushin, V.F.
Author_Institution :
Inst. for Phys. of Microstruct., Russian Acad. of Sci., Nizhny Novgorod
Abstract :
The method of scanning near-field optical microscope (SNOM) probe fabrication with high transmission coefficients on the base of tapered single-mode optical fiber are studied. The various methods of improvement of resolution of SNOM and application for modification and diagnostics of sample surface are discussed
Keywords :
near-field scanning optical microscopy; optical fibre fabrication; SNOM probe fabrication; high transmission coefficients; sample surface diagnostics; scanning near-field optical microscope; tapered single-mode optical fiber; Character generation; IEEE catalog; Microwave technology; Optical device fabrication; Optical fibers; Optical microscopy; Organizing; Probes;
Conference_Titel :
Microwave & Telecommunication Technology, 2005 15th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-80-4
DOI :
10.1109/CRMICO.2005.1565055
